- US11899373utility2024Proximity Effect Correction in Electron Beam Lithography0 cites
- US11899368utility2024Manufacturing Method of Semiconductor Device and Semiconductor Processing System0 cites
- US11898916utility2024Device for Temperature Monitoring of a Semiconductor Device0 cites
- US11894410utility2024Bond Pad Structure for Bonding Improvement0 cites
- US11895832utility2024Memory Integrated Circuit0 cites
- US11895819utility2024Implantations for Forming Source/drain Regions of Different Transistors0 cites
- US11892678utility2024Photonic Device and Method of Making Same0 cites
- US11892681utility2024Fiber to Chip Coupler and Method of Making the Same0 cites
- US11894411utility2024Image Sensor Device and Methods of Forming the Same0 cites
- US11893333utility2024Hybrid Sheet Layout, Method, System, and Structure0 cites
- US11894237utility2024Ultra Narrow Trench Patterning with Dry Plasma Etching0 cites
- US11894438utility2024Semiconductor Device and Manufacturing Method Thereof0 cites
- US11894086utility2024Method, Device, and Circuit for High-speed Memories0 cites
- US11894238utility2024Method of Fabricating Semiconductor Device with Reduced Trench Distortions0 cites
- US11894260utility2024Replacement Material for Backside Gate Cut Feature0 cites
- US11892427utility2024Biofet System0 cites
- US11892382utility2024Method for Detecting Environmental Parameter in Semiconductor Fabrication Facility0 cites
- US11892774utility2024Lithography0 cites
- US11895933utility2024Resistive Memory Cell with Switching Layer Comprising One or More Dopants0 cites