- US11996327utility2024Interconnect Structure and Methods of Forming the Same0 cites
- US11996326utility2024Barrier Structure for Semiconductor Device0 cites
- US11996325utility2024Interconnect Structure of Semiconductor Device0 cites
- US11996323utility2024Semiconductor Device with Source/drain Epitaxial Layer0 cites
- US11996333utility2024Source/drain EPI Structure for Improving Contact Quality0 cites
- US11996321utility2024Semiconductor Structure and Method for Forming the Same0 cites
- US11996308utility2024Method for Mapping Wafers in a Wafer Carrier0 cites
- US11996297utility2024Method of Manufacturing a Semiconductor Device0 cites
- US11996461utility2024Backside Gate Contact0 cites
- US11996283utility2024Method for Metal Gate Surface Clean0 cites
- US11996227utility2024Hexagonal Semiconductor Package Structure0 cites
- US11996163utility2024Bit Line Logic Circuits and Methods0 cites
- US11996140utility2024SRAM Structure with Asymmetric Interconnection0 cites
- US11996137utility2024Compute in Memory (CIM) Memory Array0 cites
- US11995388utility2024Integrated Circuit and Method of Forming Same0 cites
- US11993066utility2024Chuck, Lamination Process, and Manufacturing Method of Semiconductor Package Using the Same0 cites
- US11993510utility2024Composite Spring Structure to Reinforce Mechanical Robustness of a MEMS Device0 cites
- US11993512utility2024Dual Micro-electro Mechanical System and Manufacturing Method Thereof0 cites
- US11993854utility2024Chamber Wall Polymer Protection System and Method0 cites
- US11994534utility2024Testing Device for Integrated Circuit Package0 cites