- US12230549utility2025Three-dimensional Integrated Circuit Structures and Methods of Forming the Same0 cites
- US12230545utility2025Semiconductor Devices Including Dummy Gate Dielectric Layer and Methods of Manufacturing Thereof0 cites
- US12230542utility2025Method for Dicing a Semiconductor Wafer Structure0 cites
- US12230537utility2025Semiconductor Device Structure Having Air Gap and Methods of Forming the Same0 cites
- US12230524utility2025Control System for Wafer Transport Vehicle and Method for Operating the Same0 cites
- US12230517utility2025Exhaust System and Process Equipment0 cites
- US12230513utility2025Cross-wafer Rdls in Constructed Wafers0 cites
- US12230507utility2025Method of Manufacturing Semiconductor Devices Using Directional Process0 cites
- US12230352utility2025Memory Device, Memory Cell Read Circuit, and Control Method for Mismatch Compensation0 cites
- US12230338utility2025Semiconductor Memory Devices with Diode-connected MOS0 cites
- US12230323utility2025Memory Cell Array Circuit and Method of Forming the Same0 cites
- US12230320utility2025Dynamic Inhibit Voltage to Reduce Write Power for Random-access Memory0 cites
- US12229489utility2025System and Method of Verifying Slanted Layout Components0 cites
- US12229488utility2025Phase Shifter Circuit, Phase Shifter Layout and Method of Forming the Same0 cites
- US12229006utility2025Integrated Circuit and Method of Operating Same0 cites
- US12229003utility2025Memory Error Detection and Correction0 cites
- US12228958utility2025Voltage Reference Temperature Compensation Circuits and Methods0 cites
- US12228863utility2025EUV Light Source Contamination Monitoring System0 cites
- US12228768utility2025Fabrication Process Control in Optical Devices0 cites
- US12228598utility2025System and Method of Measuring Capacitance of Device-under-test0 cites