- US12575133utility2026Transistor Device with Work Function Metal Layers and Method Thereof0 cites
- US12575134utility2026Multi-gate Devices with Reduced Contact Resistance and Methods of Forming the Same0 cites
- US12575108utility2026Memory Device, Integrated Circuit, and Manufacturing Method of Memory Device0 cites
- US12575123utility2026Semiconductor Device and Manufacturing Method Thereof0 cites
- US12573467utility2026Sense Amplifier and Output Latch Circuit for Testing0 cites
- US12575086utility2026Semiconductor Device Including Insulating Element and Method of Making0 cites
- US12573843utility2026Gan-based Semiconductor Device and Electrostatic Discharge (ESD) Clamp Circuit0 cites
- US12575188utility2026Integrated Circuit and Method of Forming the Same0 cites
- US12575109utility2026Antiferroelectric Non-volatile Memory0 cites
- US12575107utility2026Memory Device0 cites
- US12575187utility2026Integrated Circuit and Method of Forming the Same0 cites
- US12572086utility2026Apparatus for Treating Substrate0 cites
- US12575202utility2026Image Sensor and Method of Forming the Same0 cites
- US12571963utility2026Polarization Beam Splitter Rotator0 cites
- US12575114utility2026Semiconductor Device and Method of Forming the Same0 cites
- US12572050utility2026Semiconductor Device Including Optical Ring Waveguide0 cites
- US12572726utility2026Attribute-point-based Timing Constraint Formal Verification0 cites
- US12568780utility2026Semiconductor Device and Method of Manufacturing0 cites
- US12568785utility2026Particle Removal Method in Semiconductor Fabrication Process0 cites
- US12567460utility2026Tracking Worst Case Memory Cells by Suppressing Tracking Wordline Voltage0 cites