- US12315843utility2025Hybrid Bonding Technology for Stacking Integrated Circuits0 cites
- US12315837utility2025Storage Layers for Wafer Bonding0 cites
- US12315864utility2025Method of Manufacturing a Semiconductor Device and a Semiconductor Device0 cites
- US12315819utility2025Method of Forming Rdls and Structure Formed Thereof0 cites
- US12315817utility2025Dielectric on Wire Structure to Increase Processing Window for Overlying Via0 cites
- US12315806utility2025Electronic Device and Manufacturing Method Thereof0 cites
- US12315791utility2025Metal-insulator-metal Capacitor Within Metallization Structure0 cites
- US12315786utility2025Semiconductor Structure and Manufacturing Method Thereof0 cites
- US12315784utility2025Semiconductor Package and Manufacturing Method Thereof0 cites
- US12315730utility2025Semiconductor Devices with Metal Intercalated High-k Capping0 cites
- US12315562utility2025RRAM Circuit and Method0 cites
- US12315560utility2025Integrated Circuit Device and Manufacturing Method of the Same0 cites
- US12315561utility2025Semiconductor Memory Devices with Different Word Lines0 cites
- US12315863utility2025Contact Structures in Semiconductor Devices0 cites
- US12314650utility2025Integrated Circuit Device and Manufacturing Method of the Same0 cites
- US12313879utility2025Semiconductor Device, Photonic Circuit and Method for Adjusting Resonant Wavelength of Optical Modulator0 cites
- US12313675utility2025Method and Device for Wafer-level Testing0 cites
- US12311498utility2025Monolithic Platen0 cites
- US12316828utility2025Automatic Time Delay and Integration (TDI) Mask Inspection System Calibration0 cites
- US12317552utility2025Semiconductor Device Structure and Method for Forming the Same0 cites