- US11670586utility2023Semiconductor Device with Source Resistor and Manufacturing Method Thereof0 cites
- US11670601utility2023Stacking via Structures for Stress Reduction0 cites
- US11670608utility2023Prevention of Metal Pad Corrosion Due to Exposure to Halogen0 cites
- US11664278utility2023Semiconductor Device with L-shape Conductive Feature and Methods of Forming the Same0 cites
- US11662661utility2023EUV Pellicle with Structured Ventilation Frame0 cites
- US11662668utility2023Lithography Contamination Control0 cites
- US11664206utility2023Arcing Protection Method and Processing Tool0 cites
- US11664300utility2023Fan-out Packages and Methods of Forming the Same0 cites
- US11664237utility2023Semiconductor Device Having Improved Overlay Shift Tolerance0 cites
- US11664258utility2023Method for PUF Generation Using Variations in Transistor Threshold Voltage and Subthreshold Leakage Current0 cites
- US11664260utility2023Systems and Methods for Orientator Based Wafer Defect Sensing0 cites
- US11664265utility2023Systems and Methods for Robotic Arm Sensing0 cites
- US11664272utility2023Etch Profile Control of Gate Contact Opening0 cites
- US11664279utility2023Multiple Threshold Voltage Implementation Through Lanthanum Incorporation0 cites
- US11664280utility2023Semiconductor Devices with Backside Air Gap Dielectric0 cites
- US11664308utility2023Interconnect Structure and Method of Forming the Same0 cites
- US11664349utility2023Stacked Chip Package and Methods of Manufacture Thereof0 cites
- US11664350utility2023Semiconductor Device and Method of Manufacture0 cites
- US11664374utility2023Backside Interconnect Structures for Semiconductor Devices and Methods of Forming the Same0 cites
- US11664380utility2023Semiconductor Device and Method of Manufacturing the Same0 cites