- US11681221utility2023EUV Photoresist with Low-activation-energy Ligands or High-developer-solubility Ligands0 cites
- US11681225utility2023Silver Patterning and Interconnect Processes0 cites
- US11681226utility2023Metal-compound-removing Solvent and Method in Lithography0 cites
- US11681232utility2023Exhaust System with U-shaped Pipes0 cites
- US11681235utility2023System and Method for Cleaning an EUV Mask0 cites
- US11681850utility2023Multi-patterning Graph Reduction and Checking Flow Method0 cites
- US11681851utility2023Hierarchical Density Uniformization for Semiconductor Feature Surface Planarization0 cites
- US11681852utility2023Optimized Layout Cell0 cites
- US11681854utility2023Generation of Layout Including Power Delivery Network0 cites
- US11682451utility2023SRAM Devices with Reduced Coupling Capacitance0 cites
- US11682468utility2023Method and System for Replacement of Memory Cells0 cites
- US11682549utility2023Semiconductor Wafer with Modified Surface and Fabrication Method Thereof0 cites
- US11682571utility2023Apparatus and Methods for Handling Die Carriers0 cites
- US11676648utility2023Current Steering in Reading Magnetic Tunnel Junction0 cites
- US11675953utility2023Hotspot Avoidance Method of Manufacturing Integrated Circuits0 cites
- US11675505utility2023Configurable Memory Storage System0 cites
- US11675280utility2023Lithography System and Method0 cites
- US11675264utility2023Reticle Cleaning System0 cites
- US11678592utility2023Step Height Mitigation in Resistive Random Access Memory Structures0 cites
- US11678585utility2023Semiconductor Device with Asymmetrical Pinned Magnets, and Method of Manufacture0 cites