- US11728431utility2023Inner Spacers for Gate-all-around Semiconductor Devices0 cites
- US11728262utility2023Metal Plate Corner Structure on Metal Insulator Metal0 cites
- US11728254utility2023Giga Interposer Integration Through Chip-on-wafer-on-substrate0 cites
- US11728244utility2023Semiconductor Device and Method for Forming the Same0 cites
- US11728233utility2023Chip Package Structure with Ring Structure and Method for Forming the Same0 cites
- US11728226utility2023Deposition System and Method0 cites
- US11728219utility2023Method for Fabricating a Semiconductor Device0 cites
- US11728218utility2023Semiconductor Device and Method0 cites
- US11728216utility2023Semiconductor Device with Reduced Contact Resistance and Methods of Forming the Same0 cites
- US11728171utility2023Semiconductor Device with Metal Gate Fill Structure0 cites
- US11728170utility2023Contact Structure0 cites
- US11728169utility2023Semiconductor Device0 cites
- US11728173utility2023Masking Layer with Post Treatment0 cites
- US11727976utility2023Semiconductor Devices Including Ferroelectric Memory and Methods of Forming the Same0 cites
- US11726408utility2023Multiple-mask Multiple-exposure Lithography and Masks0 cites
- US11726342utility2023Multifunctional Collimator for Contact Image Sensors0 cites
- US11726187utility2023High Resolution Low Power Inter-correlation SPAD Assisted Time-of-flight Sensor0 cites
- US11726122utility2023Antenna Testing Device and Method for High Frequency Antennas0 cites
- US11726112utility2023Electromagnetic Shielding During Wafer Stage Testing0 cites
- US11725278utility2023Systems and Methods for a Plasma Enhanced Deposition of Material on a Semiconductor Substrate0 cites