- US12596078utility2026Apparatus for Analyzing Metal Contamination of a Wafer and a Method Thereof0 cites
- US12533873utility2026Device and Method for Separating Wafers0 cites
- US12536642utility2026Device for Evaluating Edge Defects in a Silicon Wafer and Method Therof0 cites
- US12451378utility2025Wax Coating Apparatus for Wafer Mounting and Wafer Mounting Apparatus Including Same0 cites
- US12394672utility2025Method for Evaluating of Defect Area of Wafer0 cites
- US12351939utility2025Ingot Growing Apparatus and Method Thereof0 cites
- US12351940utility2025Liner and Epitaxial Reactor Comprising Same0 cites
- US12325103utility2025Carrier Recycling Process0 cites
- US12285841utility2025Automatic Abrasion Compensation System of Lower Plate and Wafer Lapping Apparatus Having the Same0 cites
- US12288699utility2025Single Wafer-type Wafer Cleaning Device and Method for Controlling Surface Roughness of Wafer Using Same0 cites
- US12275165utility2025Workplate for Y-axis Compensation of Ingot and Y-axis Compensation Method of Ingot Using the Same0 cites
- US12247939utility2025Ingot Growing Apparatus and Monitoring Method Thereof0 cites
- US12173426utility2024Raw Material Supply Unit, and Apparatus Comprising Same for Growing Single-crystal Silicon Ingot0 cites
- US12118706utility2024Method and Apparatus of Evaluating Quality of Wafer or Single Crystal Ingot0 cites
- US12110608utility2024Apparatus of Oxidation-combusting an Ingot Grower and Method Thereof0 cites
- US12090685utility2024Ingot Temperature Controller and Wire Sawing Device Having Same0 cites
- US12076835utility2024Air Circulation System and Final Polishing Apparatus Including the Same0 cites
- US12051598utility2024Wafer Cleaning Device0 cites
Page 1 of 2Next →