- US12488852utility2025Read-only Memory Diagnosis and Repair0 cites
- US12481809utility2025Adaptive User Interfaces for Computer-aided Technology Applications0 cites
- US12482090utility2025Wafer Image Defect Detection and Characterization for Manufacturing Process Calibration0 cites
- US12474990utility2025Hardware-based Sensor Analysis0 cites
- US12455547utility2025Managing a Postprocessor for Machining with a Machine Tool Method, Computer System, and Machine Tool0 cites
- US12452148utility2025Method of Determining a Bit Length of an IQ Sample0 cites
- US12437129utility2025Modelling Method and System0 cites
- US12411405utility2025Optical Proximity Correction Based on Combining Inverse Lithography Technology with Pattern Classification0 cites
- US12411998utility2025Self-intersecting Lattice Incarnation0 cites
- US12373195utility2025Method of Programming a Software Module Associated with a Firmware Unit of a Device0 cites
- US12333649utility2025Method of Bounding Spatial Data Utilizing Three-dimensional Axis-aligned Bounding Boxes0 cites
- US12335758utility2025Method and Device for Testing a Base Station0 cites
- US12314207utility2025High Bandwidth IJTAG Through High Speed Parallel Bus0 cites
- US12299951utility2025Edge Center Point-based Characterization of Semiconductor Layout Designs0 cites
- US12277377utility2025Efficient Scheduling of Tasks for Resolution Enhancement Technique Operations0 cites
- US12222919utility2025Method of Indexing a Hierarchical Data Structure0 cites
- US12197819utility2025Probabilistic Design for Metamaterials Represented as Program Code0 cites
- US12182487utility2024Controllable Pattern Clustering for Characterized Semiconductor Layout Designs0 cites