Patents/Assignees

SHIMADZU CORPORATION

688 patents in portfolio

US11835205utility2023
Light Source Device, Projector, Machining Device, Light Source Unit, and Light Source Device Adjusting Method
0 cites
US11835597utility2023
Magnetic Detection System, Magnetic Signal Waveform Pattern Classification Method, and Waveform Pattern Distribution Generation Method for Magnetic Detection System
0 cites
US11835049utility2023
Turbo-molecular Pump
0 cites
US11828737utility2023
Preparative Liquid Chromatograph
0 cites
US11830714utility2023
Analysis Method and Non-transitory Computer Readable Medium
0 cites
US11830195utility2023
Training Label Image Correction Method, Trained Model Creation Method, and Image Analysis Device
0 cites
US11829357utility2023
Analysis Assistance Device, Analysis Assistance Method and Non-transitory Computer Readable Medium Storing Analysis Assistance Program
0 cites
US11828738utility2023
Detector for Liquid Chromatograph
0 cites
US11827908utility2023
Polypeptide Having Luciferase Activity
0 cites
USD1005326design2023
Display Screen or Portion Thereof of an Electrophoresis Device with Graphical User Interface
0 cites
USD1005328design2023
Display Screen or Portion Thereof of an Electrophoresis Device with Graphical User Interface
0 cites
US11819859utility2023
Field Flow Fractionation Device
0 cites
US11821851utility2023
X-ray Imaging Apparatus
0 cites
US11821875utility2023
Material Testing Machine
0 cites
US11821878utility2023
Autosampler
0 cites
US11821879utility2023
Autosampler for Chromatograph
0 cites
US11824321utility2023
Method of Fabricating Tubular Laser Light Source, Tubular Laser Light Source and Detection Device Using Tubular Laser Light Source
0 cites
US11815432utility2023
Thermal Conductivity Detector and Gas Chromatograph Including Same
0 cites
US11815433utility2023
Adsorption Apparatus and Chemiluminescence Type Nitrogen Oxide Concentration Meter
0 cites
US11815493utility2023
Defect Inspection Apparatus and Defect Inspection Method
0 cites

← PreviousPage 27 of 35Next →