Patents/Assignees

SEMILAB Semiconductor Physics Laboratory Co., Ltd.

3 patents in portfolio

US12154833utility2024
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
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US12027430utility2024
Semiconductor Doping Characterization Method Using Photoneutralization Time Constant of Corona Surface Charge
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US11561254utility2023
Topside Contact Device and Method for Characterization of High Electron Mobility Transistor (HEMT) Heterostructure on Insulating and Semi-insulating Substrates
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