Semiconductor Manufacturing International (Beijing) Corporation
123 patents in portfolio
- US12131990utility2024Semiconductor Structure with a Contact to Source/drain Layers and Fabrication Method Thereof0 cites
- US12125896utility2024Semiconductor Device and Forming Method Thereof0 cites
- US12096696utility2024Semiconductor Structure and Fabrication Method Thereof0 cites
- US12087582utility2024Improving Resolution of Masks for Semiconductor Manufacture0 cites
- US12089501utility2024Semiconductor Structure and Fabrication Method Thereof0 cites
- US12080596utility2024Semiconductor Structure and Forming Method Thereof0 cites
- US12074163utility2024Semiconductor Structure and Fabrication Method Thereof0 cites
- US12075705utility2024Semiconductor Structure and Fabrication Method Thereof0 cites
- US12068397utility2024Semiconductor Structure and Fabrication Method Thereof0 cites
- US12051737utility2024Semiconductor Device and Fabrication Method Thereof0 cites
- US12048133utility2024Semiconductor Structure0 cites
- US12022740utility2024Semiconductor Structure Formation Method0 cites
- US12015067utility2024Semiconductor Device and Fabrication Method Thereof0 cites
- US11995814utility2024Detection Method and Apparatus, Electronic Device, and Storage Medium0 cites
- US11996460utility2024Semiconductor Structure and Forming Method for Thereof0 cites
- US11996469utility2024Semiconductor Structure and Method for Forming the Same0 cites
- US11988968utility2024Method for Detecting Overlay Precision and Method for Compensating Overlay Deviation0 cites
- US11990415utility2024Semiconductor Device and Method for Forming the Same0 cites
- US11961737utility2024Semiconductor Structure and Manufacturing Method0 cites
- US11955483utility2024Semiconductor Device and Fabrication Method Thereof0 cites