Patents/Assignees

Samsung Electronics Co., Ltd.

23,127 patents in portfolio

US11600608utility2023
Semiconductor Package
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US11600607utility2023
Semiconductor Module Including Multiple Power Management Semiconductor Packages
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US11600601utility2023
Semiconductor Package
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US11600596utility2023
Semiconductor Package
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US11600570utility2023
Semiconductor Memory Device and Method of Fabricating the Same
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US11600569utility2023
Integrated Circuit Device and Method of Manufacturing the Same
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US11600564utility2023
Redistribution Substrate, Method of Fabricating the Same, and Semiconductor Package Including the Same
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US11600556utility2023
Semiconductor Package
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US11600552utility2023
Semiconductor Device Having a Through Silicon via and Methods of Manufacturing the Same
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US11600545utility2023
Semiconductor Devices Including a Lower Semiconductor Package, an Upper Semiconductor Package on the Lower Semiconductor Package, and a Connection Pattern Between the Lower Semiconductor Package and the Upper Semiconductor Package
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US11600539utility2023
Defect Detection Structure of a Semiconductor Die, Semiconductor Device Including the Same and Method of Detecting Defects in Semiconductor Die
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US11600537utility2023
Magnetic Property Measuring System, a Method for Measuring Magnetic Properties, and a Method for Manufacturing a Magnetic Memory Device Using the Same
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US11600553utility2023
Semiconductor Device Including Through Substrate Vias and Method of Manufacturing the Semiconductor Device
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US11600518utility2023
Semiconductor Device and Method of Fabricating the Same
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US11600515utility2023
Die Pickup Module and Die Bonding Apparatus Including the Same
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US11600511utility2023
Substrate Processing Apparatus
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US11600495utility2023
Method of Manufacturing Semiconductor Device
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US11600382utility2023
Method, Electronic Device, and Storage Medium for Providing Recommendation Service
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US11600353utility2023
Test Method for Memory Device, Operation Method of Test Device Testing Memory Device, and Memory Device with Self-test Function
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US11600350utility2023
Methods of Testing Nonvolatile Memory Devices
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