Patents/Assignees

POINT ENGINEERING CO., Ltd.

28 patents in portfolio

US12618870utility2026
Vertical Probe Card
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US12546812utility2026
Test Device Capable of Testing Micro LED and Manufacturing Method Thereof
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US12546818utility2026
Guide Plate and Test Device Including Same
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US12540414utility2026
Anodic Aluminum Oxide Mold, Mold Structure Including Same, Method of Manufacturing Molded Article Using Anodic Aluminum Oxide Mold, and Molded Article Manufactured Thereby
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US12506091utility2025
Anodized Film Substrate Base, Anodized Film Substrate Part Having Same, Anodized Film-based Interposer Having Same, and Semiconductor Package Having Same
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US12493052utility2025
Electrically Conductive Contact Pin, Inspection Apparatus, and Molded Product
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US12296378utility2025
Method of Manufacturing Metal Product and Mold Used Therefor
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US12270828utility2025
Probe Card
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US12222370utility2025
Probe Head and Probe Card Having Same
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US12169212utility2024
Probe Head and Probe Card Comprising Same
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US12151461utility2024
Manufacturing Method of Anodic Oxide Film Structure and Anodic Oxide Film Structure
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USD1051865design2024
Semiconductor Probe Pin
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US12135338utility2024
Probe Head and Probe Card Comprising Same
0 cites
USD1030689design2024
Semiconductor Probe Pin
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US11860192utility2024
Probe Head and Probe Card Having Same
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US11852656utility2023
Probe Head and Probe Card Having Same
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US11852655utility2023
Multilayer Wiring Substrate, Method of Manufacturing Same, and Probe Card Having Same
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US11691387utility2023
Laminated Anodic Aluminum Oxide Structure, Guide Plate of Probe Card Using Same, and Probe Card Having Same
0 cites
US11696398utility2023
Anodic Aluminum Oxide Structure, Probe Head Having Same, and Probe Card Having Same
0 cites
US11651904utility2023
Multilayer Ceramic Substrate and Probe Card Including Same
0 cites

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