Patents/Assignees

PDF Solutions, Inc.

18 patents in portfolio

US12429520utility2025
Systems, Devices, and Methods for Performing a Non-contact Electrical Measurement on a Cell, Non-contact Electrical Measurement Cell Vehicle, Chip, Wafer, Die, or Logic Block
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US12431333utility2025
Systems, Devices, and Methods for Aligning a Particle Beam and Performing a Non-contact Electrical Measurement on a Cell And/or Non-contact Electrical Measurement Cell Vehicle Using a Registration Cell
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US12416663utility2025
Embedded System to Characterize BTI Degradation Effects in Mosfets
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US12229945utility2025
Wafer Bin Map Based Root Cause Analysis
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US12223012utility2025
Machine Learning Variable Selection and Root Cause Discovery by Cumulative Prediction
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US12038476utility2024
Systems, Devices, and Methods for Performing a Non-contact Electrical Measurement on a Cell, Non-contact Electrical Measurement Cell Vehicle, Chip, Wafer, Die, or Logic Block
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US12038802utility2024
Collaborative Learning Model for Semiconductor Applications
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US12020897utility2024
Systems, Devices, and Methods for Aligning a Particle Beam and Performing a Non-contact Electrical Measurement on a Cell And/or Non-contact Electrical Measurement Cell Vehicle Using a Registration Cell
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US11972552utility2024
Abnormal Wafer Image Classification
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US11972987utility2024
Die Level Product Modeling Without Die Level Input Data
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US11775714utility2023
Rational Decision-making Tool for Semiconductor Processes
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US11763446utility2023
Wafer Bin Map Based Root Cause Analysis
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US11687439utility2023
Automatic Window Generation for Process Trace
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US11668746utility2023
Systems, Devices, and Methods for Performing a Non-contact Electrical Measurement on a Cell, Non-contact Electrical Measurement Cell Vehicle, Chip, Wafer, Die, or Logic Block
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US11640160utility2023
Pattern-enhanced Spatial Correlation of Test Structures to Die Level Responses
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US11640328utility2023
Predicting Equipment Fail Mode from Process Trace
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US11609812utility2023
Anomalous Equipment Trace Detection and Classification
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US11605526utility2023
Systems, Devices, and Methods for Aligning a Particle Beam and Performing a Non-contact Electrical Measurement on a Cell And/or Non-contact Electrical Measurement Cell Vehicle Using a Registration Cell
0 cites