Patents/Assignees

PARK SYSTEMS Corp.

8 patents in portfolio

US12584941utility2026
Measurement System with Detection Mechanism and Method of Operation Thereof
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US12584942utility2026
Measurement System with Detection Mechanism and Method of Operation Thereof
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US12584866utility2026
Measurement System with Detection Mechanism and Method of Operation Thereof
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US12399195utility2025
Method for Measuring, by Measurement Device, Characteristics of Surface of Object to Be Measured, Atomic Force Microscope for Performing Same Method, and Computer Program Stored in Storage Medium to Perform Same Method
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US12038455utility2024
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
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US11761981utility2023
Method and Apparatus for Identifying Sample Position in Atomic Force Microscope
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US11619649utility2023
Atomic Force Microscope Equipped with Optical Measurement Device and Method of Acquiring Information on Surface of Measurement Target Using the Same
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US11598788utility2023
Measuring Method for Measuring Heat Distribution of Specific Space Using Sthm Probe, Method and Device for Detecting Beam Spot of Light Source
0 cites