Patents/Assignees

Nearfield Instruments B.V.

6 patents in portfolio

US12618868utility2026
Cassette for Holding a Probe
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US12546800utility2026
Automated Landing Method of a Scanning Probe Microscopy System and Scanning Probe Microscopy System Using the Same
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US12529876utility2026
Compact Optical Microscope, Metrology Device Comprising the Optical Microscope and a Wafer Positioning Metrology Apparatus Comprising the Metrology Device
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US12429496utility2025
Arrangement for and Method of Determining Cantilever Deflection in a Scanning Probe Microscopy System
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US12346036utility2025
Alignment System and Method for Aligning an Object Having an Alignment Mark
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US12123895utility2024
Method of Determining Dimensions of Features of a Subsurface Topography, Scanning Probe Microscopy System and Computer Program
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