Patents/Assignees

Microfabrica Inc.

19 patents in portfolio

US12255123utility2025
Micro Heat Transfer Arrays, Micro Cold Plates, and Thermal Management Systems for Semiconductor Devices, and Methods for Using and Making Such Arrays, Plates, and Systems
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US12196781utility2025
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
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US12196782utility2025
Probes with Planar Unbiased Spring Elements for Electronic Component Contact, Methods for Making Such Probes, and Methods for Using Such Probes
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US12181493utility2024
Compliant Probes Including Dual Independently Operable Probe Contact Elements Including at Least One Flat Extension Spring, Methods for Making, and Methods for Using
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US12146898utility2024
Multi-beam Probes with Decoupled Structural and Current Carrying Beams and Methods of Making
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US12078657utility2024
Compliant Pin Probes with Extension Springs, Methods for Making, and Methods for Using
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US12066462utility2024
Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes
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US11999016utility2024
Methods of Forming Parts Using Laser Machining
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US12000865utility2024
Multi-beam Vertical Probes with Independent Arms Formed of a High Conductivity Metal for Enhancing Current Carrying Capacity and Methods for Making Such Probes
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US11982689utility2024
Probes Having Improved Mechanical And/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making
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US11973301utility2024
Probes Having Improved Mechanical And/or Electrical Properties for Making Contact Between Electronic Circuit Elements and Methods for Making
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US11906549utility2024
Compliant Pin Probes with Flat Extension Springs, Methods for Making, and Methods for Using
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US11867721utility2024
Probes with Multiple Springs, Methods for Making, and Methods for Using
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US11828775utility2023
Vertical Probe Arrays and Improved Methods for Making Using Temporary or Permanent Alignment Structures for Setting or Maintaining Probe-to-probe Relationships
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US11821918utility2023
Buckling Beam Probe Arrays and Methods for Making Such Arrays Including Forming Probes with Lateral Positions Matching Guide Plate Hole Positions
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US11802891utility2023
Compliant Pin Probes with Multiple Spring Segments and Compression Spring Deflection Stabilization Structures, Methods for Making, and Methods for Using
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US11774467utility2023
Method of in Situ Modulation of Structural Material Properties And/or Template Shape
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US11768227utility2023
Multi-layer Probes Having Longitudinal Axes and Preferential Probe Bending Axes That Lie in Planes That Are Nominally Parallel to Planes of Probe Layers
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US11761982utility2023
Probes with Planar Unbiased Spring Elements for Electronic Component Contact and Methods for Making Such Probes
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