- US12480890utility2025Deep Learning Based Mode Selection for Inspection0 cites
- US12480893utility2025Optical and X-ray Metrology Methods for Patterned Semiconductor Structures with Randomness0 cites
- US12474281utility2025Semiconductor Measurements with Robust In-line Tool Matching0 cites
- US12474557utility2025Automated Focusing System for Tracking Specimen Surface with a Configurable Focus Offset0 cites
- US12461041utility2025Measurement of Thick Films and High Aspect Ratio Structures0 cites
- US12462968utility2025Systems and Methods for Uniform Cooling of Electromagnetic Coil0 cites
- US12449352utility2025Optics for Measurement of Thick Films and High Aspect Ratio Structures0 cites
- US12449386utility2025Forward Library Based Seeding for Efficient X-ray Scatterometry Measurements0 cites
- US12450857utility2025Automatic Method to Find Extent of Repeating Geometry in an Integrated Circuit Layout0 cites
- US12451319utility2025Electron Source with Magnetic Suppressor Electrode0 cites
- US12452987utility2025High-power Compact VUV Laser-sustained Plasma Light Source0 cites
- US12448963utility2025Asymmetric Gas Bearing Bushing for Thermo-pump0 cites
- US12443840utility2025Dynamic Control of Machine Learning Based Measurement Recipe Optimization0 cites
- US12444064utility2025Quantitative Linear Independent Vector Based Method (QLIVBM) for Image Alignment0 cites
- US12444155utility2025Robust Image-to-design Alignment for Dram0 cites
- US12444174utility2025Rare Event Training Data Sets for Robust Training of Semiconductor Yield Related Components0 cites
- US12444628utility2025Image Modeling-assisted Contour Extraction0 cites
- US12444630utility2025Single-material Waveplates for Pupil Polarization Filtering0 cites
- US12444643utility2025Method and Apparatus for Positioning Optical Isolator Assembly with Replaceable Motor Assembly0 cites
- US12422363utility2025Scanning Scatterometry Overlay Metrology0 cites