Patents/Assignees

Kabushiki Kaisha Nihon Micronics

31 patents in portfolio

US11971296utility2024
Measurement System and Measurement Method
0 cites
US11971431utility2024
Optical Probe, Optical Probe Array, Optical Probe Card, and Method of Manufacturing Optical Probe
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US11965911utility2024
Inspection Apparatus Having a Contactor for Inspecting Electrical Characteristics of an Object, a Contactor Tip Position Adjusting Unit, and a Position Adjusting Method Therefor
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US11899054utility2024
Connecting Device for Inspection
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US11874511utility2024
Connecting Apparatus and Light Condensing Substrate
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US11860190utility2024
Probe Unit with a Free Length Cantilever Contactor and Pedestal
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US11828773utility2023
Electrical Connecting Device
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US11762008utility2023
Connecting Device for Inspection
0 cites
US11709182utility2023
Electrical Connecting Device and Inspection Method
0 cites
US11624679utility2023
Optical Probe, Optical Probe Array, Test System and Test Method
0 cites
US11592402utility2023
Connecting Device for Inspection
0 cites

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