Patents/Assignees

J.A. WOOLLAM CO., Inc.

9 patents in portfolio

US12498317utility2025
Sample Alignment System in Reflectometers, Ellipsometers, Spectrophotometers and the Like
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US12449351utility2025
Method of Determining Absorption and Extinction Coefficient of Prism Shaped Material
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US12405210utility2025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
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US12332163utility2025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
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US11885738utility2024
Reflectometer, Spectrophotometer, Ellipsometer or Polarimeter System Including Sample Imaging System That Simultaneously Meet the Scheimpflug Condition and Overcomes Keystone Error
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US11821833utility2023
Fast and Accurate Mueller Matrix Infrared Ellipsometer
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US11740176utility2023
Fast and Accurate Mueller Matrix Infrared Spectroscopic Ellipsometer
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US11675208utility2023
Reflectometer, Spectrophotometer, Ellipsometer and Polarimeter System with a Super Continuum Laser Source of a Beam of Electromagnetism, and Improved Detector System
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US8345241utility2013
Application of Digital Light Processor in Imaging Ellipsometer and the Like Systems
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