ICT Integrated Circuit Testing Gesellschaft Für Halbleiterprüftechnik Mbh
10 patents in portfolio
- US12542253utility2026Charged Particle Optics, Charged Particle Beam Apparatus, and Method for Scanning a Charged Particle Beam0 cites
- US12451322utility2025Method of Forming a Multipole Device, Method of Influencing an Electron Beam, and Multipole Device0 cites
- US12412727utility2025Charged Particle Beam System, Corrector for Aberration Correction of a Charged Particle Beam, and Method Thereof0 cites
- US12308203utility2025Methods of Determining Aberrations of a Charged Particle Beam, and Charged Particle Beam System0 cites
- US11817292utility2023Primary Charged Particle Beam Current Measurement0 cites
- US11810753utility2023Methods of Determining Aberrations of a Charged Particle Beam, and Charged Particle Beam System0 cites
- US11791128utility2023Method of Determining the Beam Convergence of a Focused Charged Particle Beam, and Charged Particle Beam System0 cites
- US11705301utility2023Charged Particle Beam Manipulation Device and Method for Manipulating Charged Particle Beamlets0 cites