Patents/Assignees

HITACHI HIGH-TECH CORPORATION

704 patents in portfolio

US12211194utility2025
Defect Inspection with Images of Different Synthesis Ratios
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US12211665utility2025
Charged Particle Beam Device
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US12211668utility2025
Charged Particle Beam Device
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US12211674utility2025
Plasma Processing Apparatus
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US12203951utility2025
Automated Analysis Device, and Analysis Method
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US12201855utility2025
Particle Beam Therapy System and Magnetic Resonance Imaging Apparatus
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US12205790utility2025
Charged Particle Beam Device
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US12196707utility2025
Electrophoresis Method
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US12196773utility2025
Automatic Analysis Device, Cold Storage, and Method for Cooling Reagent in Automatic Analysis Device
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US12196802utility2025
Semiconductor Inspection Device and Method for Inspecting Semiconductor Sample
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US12198327utility2025
Measurement System, Method for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure, and Recording Medium for Storing Program for Causing Computer to Execute Processing for Generating Learning Model to Be Used When Performing Image Measurement of Semiconductor Including Predetermined Structure
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US12198892utility2025
Sample Holder and Charged Particle Beam Apparatus
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US12196670utility2025
Far-infrared Spectroscopy Device
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US12196673utility2025
Defect Inspection Apparatus and Defect Inspection Method
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US12198894utility2025
Measurement System and Method of Setting Parameter of Charged Particle Beam Device
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US12191111utility2025
Charged Particle Beam System and Method for Determining Observation Conditions in Charged Particle Beam Device
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US12186758utility2025
Automated Analysis Device
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US12191121utility2025
Plasma Processing Apparatus
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US12188952utility2025
Automatic Analysis Device
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US12188953utility2025
Automatic Analyzer
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