Patents/Assignees

HITACHI HIGH-TECH CORPORATION

704 patents in portfolio

US12345661utility2025
Defect Inspection Apparatus and Defect Inspection Method
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US12345994utility2025
Electrophoresis Device
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US12347074utility2025
Pattern Measurement System, Pattern Measurement Method, and Program for Measuring Edge Roughness at the Edge of a Pattern Based on a Random Noise Component
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US12345522utility2025
Computer System, Dimension Measurement Method, and Storage Medium
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US12347656utility2025
Plasma Processing Apparatus
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US12347707utility2025
Semiconductor Analysis System
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US12345728utility2025
Automated Analysis Device and Method for Leveling Same
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US12339655utility2025
Automatic Analysis Device and Maintenance Guide Method in Automatic Analysis Device
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US12339407utility2025
Device for Detecting Charged Particles or Radiation
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US12340970utility2025
Charged Particle Beam Device, and Method for Controlling Charged Particle Beam Device
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US12339292utility2025
Automatic Analyzer
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US12332262utility2025
Specimen Transport Apparatus
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US12333131utility2025
Automated Analyzer Displaying a GUI Including First and Second Inspection Information
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US12332258utility2025
Dispensing Device and Method
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US12332209utility2025
Electrolyte Analysis Device
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US12333695utility2025
Sample Observation System and Image Processing Method
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US12332103utility2025
Dispensing Device, Automated Analysis Device, and Dispensing Method
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US12329989utility2025
Particle Therapy System, Irradiation Control Apparatus, and Irradiation Control Method
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US12334327utility2025
Mass Spectrometry Device Control Method, Mass Spectrometry System, and Voltage Control Device
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US12334316utility2025
Plasma Processing Apparatus and Plasma Processing Method
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