- US12607651utility2026Probe Card Monitoring System and Monitoring Method Thereof0 cites
- US12422457utility2025Probe Card0 cites
- US12422475utility2025Adjustable Supporting Device0 cites
- US12313654utility2025Injection Device, Semiconductor Testing System and Its Testing Method0 cites
- US12108543utility2024Testing Substrate and Manufacturing Method Thereof and Probe Card0 cites
- US11703524utility2023Probing System for Discrete Wafer0 cites
- US11656275utility2023Injection Device, Semiconductor Testing System and Its Testing Method0 cites
- US11567125utility2023Injection Device, Semiconductor Testing System and Its Testing Method0 cites