- US12617032utility2026Systems and Methods for Controlling Wafer Breakage During Ingot Slicing Operations0 cites
- US12612713utility2026Silicon Carbide Wafer and Method of Fabricating the Same0 cites
- US12613168utility2026Method of Identifying Defects in Crystals0 cites
- US12605863utility2026Methods for Controlling Wafer Breakage During Ingot Slicing Operations0 cites
- US12594644utility2026Polishing Head Assembly Having Recess and Cap0 cites
- US12595584utility2026Systems and Methods for Producing a Single Crystal Silicon Ingot Using a Vaporized Dopant0 cites
- US12590383utility2026Synthetic Crucibles with Rim Coating0 cites
- US12584959utility2026Signal Processing Method and Abnormal Sound Detection System0 cites
- US12584238utility2026Silicon Carbide Crystals and Silicon Carbide Wafer0 cites
- US12577700utility2026Non-contact Systems and Methods for Determining Distance Between Silicon Melt and Reflector in a Crystal Puller0 cites
- US12581571utility2026System and Methods for a Radiant Heat Cap in a Semiconductor Wafer Reactor0 cites
- US12557611utility2026Semiconductor on Insulator Structure Comprising a Buried High Resistivity Layer0 cites
- US12546028utility2026Ingot Puller Apparatus Having Dopant Feeders for Adding a Plurality of Dopant Batches0 cites
- US12512359utility2025Wafer Jig, Wafer Structure and Wafer Processing Method0 cites
- US12508741utility2025Ingot Wafering Systems and Methods for Slicing a Silicon Ingot0 cites
- US12502696utility2025Methods for Cleaning the Pull Cable of an Ingot Puller Apparatus0 cites
- US12503790utility2025Systems and Methods for Producing a Single Crystal Silicon Ingot Using a Vaporized Dopant0 cites
- US12503792utility2025Methods for Manufacturing a Semiconductor Wafer Using a Preheat Ring in a Wafer Reactor0 cites
- US12500126utility2025Methods for Implanting Semiconductor Structures with Ions0 cites
Page 1 of 9Next →