Patents/Assignees

Formfactor, Inc.

14 patents in portfolio

US12449445utility2025
Remote Control Devices for Probe Systems, Probe Systems That Include the Remote Control Devices, and Methods of Remotely Operating a Motorized Positioner of a Probe System
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US12442834utility2025
Vertical Probe Array Having Sliding Contacts in Elastic Guide Plate
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US12379395utility2025
Probes, Probe Blades, Tools for Probe Blades, Blade Holders, and Probe Systems for Electrically Testing a Device Under Test
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US12337467utility2025
Wafer-handling End Effectors Configured to Selectively Lift a Wafer from an Upper Surface of the Wafer, Probe Systems That Include the Wafer-handling End Effectors, and Methods of Utilizing the Wafer-handling End Effectors
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US12306243utility2025
Space Transformers Configured to Be Utilized in a Probe System, Probe Systems That Include the Space Transformers, and Related Methods
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US12203959utility2025
Methods of Establishing Contact Between a Probe Tip of a Probe System and a Device Under Test, Probe Systems That Perform the Methods, and Storage Media That Directs Probe Systems to Perform the Methods
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US12113583utility2024
Beamforming Device Testing
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US12044704utility2024
Method of Centering Probe Head in Mounting Frame
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US11927603utility2024
Probes That Define Retroreflectors, Probe Systems That Include the Probes, and Methods of Utilizing the Probes
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US11874301utility2024
Probe Systems Including Imaging Devices with Objective Lens Isolators, and Related Methods
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US11821912utility2023
Methods of Producing Augmented Probe System Images and Associated Probe Systems
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US11754511utility2023
Method and Device for Optically Representing Electronic Semiconductor Components
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US11626357utility2023
3D Electrical Integration Using Component Carrier Edge Connections to a 2D Contact Array
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US11598789utility2023
Probe Systems Configured to Test a Device Under Test and Methods of Operating the Probe Systems
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