Patents/Assignees

Femtometrix, Inc.

10 patents in portfolio

US12601778utility2026
Field-biased Nonlinear Optical Metrology Using Corona Discharge Source
0 cites
US12562333utility2026
Method and Apparatus for Non-invasive, Non-intrusive, and Un-grounded, Simultaneous Corona Deposition and SHG Measurements
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US12553708utility2026
Second-harmonic Generation for Critical Dimensional Metrology
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US12510350utility2025
Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample via Sum-frequency Vibrational Spectroscopy
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US12241924utility2025
Wafer Metrology Technologies
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US12158492utility2024
Systems and Methods for Determining Characteristics of Semiconductor Devices
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US11988611utility2024
Systems for Parsing Material Properties from Within SHG Signals
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US11946863utility2024
Second Harmonic Generation (SHG) Optical Inspection System Designs
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US11821911utility2023
Pump and Probe Type Second Harmonic Generation Metrology
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US11808563utility2023
Surface Sensing Systems and Methods for Imaging a Scanned Surface of a Sample via Sum-frequency Vibrational Spectroscopy
0 cites