Patents/Assignees

DELMIC IP B.V.

6 patents in portfolio

US12417894utility2025
Method and Manipulation Device for Handling Samples
0 cites
USRE050540reissue2025
Method for Inspecting a Sample Using an Assembly Comprising a Scanning Electron Microscope and a Light Microscope
0 cites
US12387905utility2025
Apparatus and Method for Detecting One or More Scanning Charged Particle Beams
0 cites
US12306121utility2025
Method and Apparatus for Inspecting a Sample by Means of Multiple Charged Particle Beamlets
0 cites
US12123841utility2024
Apparatus and Method for Projecting an Array of Multiple Charged Particle Beamlets on a Sample
0 cites
US11742173utility2023
Integrated Optical and Charged Particle Inspection Apparatus
0 cites