Patents/Assignees

CHUNGHWA PRECISION TEST TECH. CO., Ltd.

20 patents in portfolio

US12601759utility2026
Cantilever Probe Card Device and Light Scattering Probe
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US12601760utility2026
Probe Card Device and Tunnel-type Probe Thereof
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US12601761utility2026
Vertical Probe Card and Open-type Probe Thereof
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US12590994utility2026
Cantilever Probe Card Device and Solder Receiving Probe
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US12590990utility2026
Cantilever Probe Card Device and Micro Electro Mechanical System (MEMS) Probe
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US12504465utility2025
Test Device for Optoelectronic Integrated Circuit
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US12467949utility2025
Cantilever Probe Card Device and Light Absorption Probe
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US12203961utility2025
Vertical Probe Card Device and Fence-like Probe Thereof
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US12181496utility2024
Cantilever Probe Card and Probe Module Thereof
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US12146897utility2024
Vertical Probe Card Having Different Probes
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US12111336utility2024
Modular Vertical Probe Card
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US12092661utility2024
Cantilever Probe Card Device and Elastic Probe Thereof
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US11988686utility2024
Vertical Probe Card and Fence-like Probe Thereof
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US11933817utility2024
Probe Card Device and Transmission Structure
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US11913973utility2024
Cantilever Probe Card Device and Focusing Probe Thereof
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US11879912utility2024
Cantilever Probe Card and Carrier Thereof
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US11747395utility2023
Board-like Connector, Single-arm Bridge of Board-like Connector, and Wafer Testing Assembly
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US11699871utility2023
Board-like Connector, Dual-arm Bridge of Board-like Connector, and Wafer Testing Assembly
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US11592466utility2023
Probe Card Device and Self-aligned Probe
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US11561244utility2023
Board-like Connector, Dual-ring Bridge of Board-like Connector, and Wafer Testing Assembly
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