- US11636587utility2023Inspection of a Semiconductor Specimen0 cites
- US11636997utility2023Uniform Milling of Adjacent Materials Using Parallel Scanning Fib0 cites
- US11631179utility2023Segmentation of an Image of a Semiconductor Specimen0 cites
- US11625820utility2023Evaluating an Inspection Algorithm for Inspecting a Semiconductor Specimen0 cites
- US11626267utility2023Back-scatter Electrons (BSE) Imaging with a SEM in Tilted Mode Using Cap Bias Voltage0 cites
- US11598633utility2023Analyzing a Buried Layer of a Sample0 cites
- US11592400utility2023System, Method and Computer Program Product for Object Examination0 cites
- US11568531utility2023Method of Deep Learning-based Examination of a Semiconductor Specimen and System Thereof0 cites
- US11562476utility2023Determination of a Simulated Image of a Specimen0 cites
- US11543368utility2023X-ray Based Evaluation of a Status of a Structure of a Substrate0 cites
← PreviousPage 6 of 6