Patents/Assignees

Advantest Test Solutions, Inc.

33 patents in portfolio

US12618896utility2026
Active Thermal Interposer Device with Thermal Isolation Structures
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US12613273utility2026
Wafer Scale Active Thermal Interposer for Device Testing
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US12540967utility2026
Wafer Scale Active Thermal Interposer for Device Testing
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US12540968utility2026
Wafer Scale Active Thermal Interposer for Device Testing
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US12535522utility2026
Wafer Scale Active Thermal Interposer for Device Testing
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US12411167utility2025
Tension-based Socket Gimbal for Engaging Device Under Test with Thermal Array
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US12374420utility2025
Carrier Based High Volume System Level Testing of Devices with Pop Structures
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US12345756utility2025
Integrated Test Cell Using Active Thermal Interposer (ATI) with Parallel Socket Actuation
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US12320841utility2025
Wafer Scale Active Thermal Interposer for Device Testing
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US12320852utility2025
Passive Carrier-based Device Delivery for Slot-based High-volume Semiconductor Test System
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US12235314utility2025
Parallel Test Cell with Self Actuated Sockets
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US12235315utility2025
Test System Support Component Exchange System and Method
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US12216154utility2025
Active Thermal Interposer Device
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US12210056utility2025
Thermal Array with Gimbal Features and Enhanced Thermal Performance
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US12203958utility2025
Shielded Socket and Carrier for High-volume Test of Semiconductor Devices
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US12203979utility2025
Multi-input Multi-zone Thermal Control for Device Testing
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US12174248utility2024
Ergonomic Loading for a Test Interface Board (TIB) / Burn-in-board (BIB) in a Slot-based Test System
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US11940487utility2024
Thermal Solution for Massively Parallel Testing
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US11852678utility2023
Multi-input Multi-zone Thermal Control for Device Testing
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US11846669utility2023
Active Thermal Interposer Device
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