Measuring Device for X-ray Emission Spectrochemical Analysis
USD1120783No. D 1,120,783designGranted 3/31/2026
Claims (1)
Claim 1 (Independent)
The ornamental design for a measuring device for x-ray emission spectrochemical analysis as shown and described.
Full Description
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1 . 1 : Front perspective view 1 . 2 : Back perspective view 1 . 3 : Front 1 . 4 Back 1 . 5 : Left 1 . 6 : Right 1 . 7 : Top plan view 1 . 8 : Bottom 1 . 9 : Reference view showing a translucent part Where broken lines are used, they should be defined in the specification as forming no part of the claimed design or as showing the environment in which the article embodying the design is used.
Citations
This patent cites (7)
- US3409769
- US4459258
- USD973903
- US2009/0141862
- US2022/0128495
- US2024/0288592
- US2025/0244264