Measuring Device for X-ray Emission Spectrochemical Analysis
USD1116883No. D 1,116,883designGranted 3/10/2026
Claims (1)
Claim 1 (Independent)
The ornamental design for measuring device for x-ray emission spectrochemical analysis as shown.
Full Description
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1. Measuring device for x-ray emission spectrochemical analysis 1 . 1 : Front perspective view 1 . 2 : Back perspective view 1 . 3 : Front 1 . 4 : Top plan view 1 . 5 : Back 1 . 6 : Left 1 . 7 : Right 1 . 8 : Bottom 1 . 9 : Front reference view showing a transparent part 1 . 10 : Front reference view showing a translucent part 1 . 11 : Reference view showing a usage state
Citations
This patent cites (7)
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- US2024/0288592
- US2025/0244264