Barrel for a Test Probe

FIG. 1 is a perspective view depicting a barrel according to the present invention; FIG. 2 is a front view of the barrel of FIG. 1 ; FIG. 3 is a rear view of the barrel of FIG. 1 ; FIG. 4 is a left side view of the barrel of FIG. 1 ; FIG. 5 is a right side view of the barrel of FIG. 1 ; FIG. 6 is a top view of the barrel of FIG. 1 ; and, FIG. 7 is a bottom view of the barrel of FIG. 1 . The barrel for a test probe according to the present invention is used in testing electrical properties of a substrate or semiconductor used in information technology (IT) fields. The solid lines shown in the figures represent portions of the barrel that form part of the claimed design. The dash-single dotted lines indicate boundary lines between the claimed portions and the disclaimed portions, and are for illustration only and form no part of the claimed design.