Probe Head for a Metrology Instrument
USD1082571No. D 1,082,571designGranted 7/8/2025
Claims (1)
Claim 1 (Independent)
The ornamental design for a probe head for a metrology instrument as shown and described.
Full Description
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1. Probe head for a metrology instrument
1 . 1 : Front
1 . 2 : Back
1 . 3 : Top
1 . 4 : Bottom
1 . 5 : Right
1 . 6 : Left
1 . 7 : Perspective
1 . 8 : Perspective
Articulating support for metrology instrument; the broken line showing is for the purpose of illustrating portions of the article and forms no part of the claimed design.
Citations
This patent cites (17)
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