Probe for Measuring Electrical Characteristics
Claims (1)
The ornamental design for a probe for measuring electrical characteristics, as shown and described.
Full Description
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FIG. 1 is a perspective view of a probe for measuring electrical characteristics showing my new design;
FIG. 2 is a front view thereof, the rear view being a mirror image thereof;
FIG. 3 is a right side view thereof, the left side view being a mirror image thereof;
FIG. 4 is a top view thereof;
FIG. 5 is a bottom view thereof;
FIG. 6 is a cross-sectional view thereof taken along line 6 - 6 in FIG. 2 ;
FIG. 7 is an enlarged cross-sectional view thereof taken along line 7 - 7 in FIG. 2 ; and,
FIG. 8 is an enlarged cross-sectional view thereof taken along line 8 - 8 in FIG. 2 .
The dashed broken lines illustrate portions of the probe for measuring electrical characteristics that form no part of the claimed design. The dot-dash broken lines define boundaries of the claimed design and form no part thereof.
Citations
This patent cites (8)
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