Sample Processing Instrument

FIG. 1 is a top-front-right perspective view of a sample processing instrument, showing our new design, according to a first embodiment thereof;

FIG. 2 is a front elevation view thereof, according to the first embodiment thereof;

FIG. 3 is a rear elevation view thereof, according to the first embodiment thereof;

FIG. 4 is a left side elevation view thereof, according to the first embodiment thereof;

FIG. 5 is a right side elevation view thereof, according to the first embodiment thereof;

FIG. 6 is a top plan view thereof, according to the first embodiment thereof;

FIG. 7 is a bottom plan view thereof, according to the first embodiment thereof;

FIG. 8 is a top-front-right perspective view thereof, according to a second embodiment thereof;

FIG. 9 is a front elevation view thereof, according to the second embodiment thereof;

FIG. 10 is a rear elevation view thereof, according to the second embodiment thereof;

FIG. 11 is a left side elevation view thereof, according to the second embodiment thereof;

FIG. 12 is a right side elevation view thereof, according to the second embodiment thereof;

FIG. 13 is a top plan view thereof, according to the second embodiment thereof; and,

FIG. 14 is a bottom plan view thereof, according to the second embodiment thereof.

In FIGS. 8 - 14 , different stippling patterns indicate different regions of contrasting appearance.